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UNIVERSITÀ DEGLI STUDI
DEL SANNIO   Benevento

Pubblicazioni di ateneo

Found 7 results
[ Author(Desc)] Titolo Tipo Anno
Filters: Author is Arpaia, P.  [Clear All Filters]
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Arpaia, P.., P.. Cimmino, L.. Fiscarelli, and S.. Rapuano, "Non-linearity compensation of high-performance data acquisition systems for magnetic measurements", 20th {IMEKO} {World} {Congress} 2012, vol. 3, pp. 2196–2199, 2012.
Arpaia, P.., L.. Michaeli, and S.. Rapuano, "Model-based compensation of SAR nonlinearity", IEEE Transactions on Instrumentation and Measurement, vol. 58, no. 3, pp. 541–550, 2009.
Arpaia, P.., P.. Daponte, and S.. Rapuano, "A state of the art on ADC modelling", Computer Standards and Interfaces, vol. 26, no. 1, pp. 31–42, 2004.
Arpaia, P.., P.. Daponte, and S.. Rapuano, "Characterization of digitizer timebase jitter by means of the Allan variance", Computer Standards and Interfaces, vol. 25, no. 1, pp. 15–22, 2003.
Arpaia, P.., L.. Michaeli, and S.. Rapuano, "Compensation of intrinsic nonlinearity of SAR {ADCs", Conference Record - IEEE Instrumentation and Measurement Technology Conference, vol. 1, pp. 725–730, 2002.
Arpaia, P.., P.. Daponte, and S.. Rapuano, "A state of the art on ADC modeling", 4th {IMEKO} {TC}4 {Conference} on {Advanced} {A}/{D} and {D}/{A} {Conversion} {Techniques} and {Their} {Applications} and the 7th {Workshop} on {ADC} {Modelling} and {Testing} 2002: IMEKO-International Measurement Federation Secretariat, 2002.
Arpaia, P.., P.. Daponte, and S.. Rapuano, "Characterization of digitizer Timebase jitter by means of the Allan variance", 11th {IMEKO} {TC}4 {Symposium} on {Trends} in {Electrical} {Measurements} and {Instrumentation} and 6th {IMEKO} {TC}4 {Workshop} on {ADC} {Modelling} and {Testing} 2001: IMEKO-International Measurement Federation Secretariat, pp. 492–496, 2001.