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UNIVERSITÀ DEGLI STUDI
DEL SANNIO   Benevento
 

An extension to IEEE Std. 1241 Sine Fit for Analog-to-Information Converters Testing

Daponte, P., L. De Vito, and S.. Rapuano, "An extension to IEEE Std. 1241 Sine Fit for Analog-to-Information Converters Testing", Proc. of IEEE Int. Instrum. and Meas. Tech. Conf., pp. 1933–1937, May 11–14, 2015.