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UNIVERSITÀ DEGLI STUDI
DEL SANNIO   Benevento
 

An improved ADC-Error-correction scheme based on a bayesian approach

De Vito, L., L.. Michaeli, and S.. Rapuano, "An improved ADC-Error-correction scheme based on a bayesian approach", IEEE Transactions on Instrumentation and Measurement, vol. 57, no. 1, pp. 128–133, 2008.