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UNIVERSITÀ DEGLI STUDI
DEL SANNIO   Benevento
 

Optoelectronic refractive index measurements: Application to smart processing

Cusano, A.., A.. Cutolo, M.. Giordano, and L.. Nicolais, "Optoelectronic refractive index measurements: Application to smart processing", IEEE Sensors Journal, vol. 3, no. 6, pp. 781-787, 2003.