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UNIVERSITÀ DEGLI STUDI
DEL SANNIO   Benevento
 

Pubblicazioni

2008
Martinelli, U., F. Bavaro, A. Greco, C. Castellano, G. Vevato, G. Abate, S.. Rapuano, E.. Balestrieri, P.. Daponte, M. Napolitano, et al., "Cytometry and innovation, the impact project.", CYTOMETRY. PART A, vol. 73A, pp. 73–73, 2008.
Balestrieri, E.., "DAC time-domain specifications toward standardization", IEEE Transactions on Instrumentation and Measurement, vol. 57, no. 7, pp. 1290-1297, 2008.
Boyer, W.., T.. Linnenbrink, J.. Blair, F.. Alegria, E.. Balestrieri, D.. Bergman, P.. Daponte, R.. Graham, D.. Larson, S.. Max, et al., "IEEE 1057 standard for Digitizing Waveform Recorders", IEEE 1057 standard for digitizing waveform recorders”, IEEE, Apr. 2008., vol. 1, Piscataway (NJ), IEEE, 2008.
Balestrieri, E.., P.. Daponte, and S.. Rapuano, "Preliminary report on ADC characterization in the frequency domain in the international standards", 16th IMEKO TC4 Int. Symp.: Exploring New Frontiers of Instrum. and Methods for Electrical and Electronic Measurements; 13th TC21 Int. Workshop on ADC Modelling and Testing - Joint Session, Proc., pp. 1151-1156, 2008.
2007
Martinelli, U., F. Bavaro, A. Greco, C. Castellano, V. G. L, G. Abate, S.. Rapuano, E.. Balestrieri, P.. Daponte, M. Napolitano, et al., "Cytometry and innovation, imPACT project", Proc. of {XXV} {National} {Conference} on {Cytometery}, 2007.
Balestrieri, E.., and S.. Rapuano, "DAC consistent terminology: static parameter definitions", Measurement: Journal of the International Measurement Confederation, vol. 40, no. 5, pp. 500-508, 2007.
Balestrieri, E.., and S.. Rapuano, "Defining DAC performance in the frequency domain", Measurement: Journal of the International Measurement Confederation, vol. 40, no. 5, pp. 463-472, 2007.
2006
Linnenbrink, T.E.., J.. Blair, S.. Rapuano, P.. Daponte, E.. Balestrieri, L.. De Vito, S.. Max, and S.J.. Tilden, "ADC testing - Part 7 in a series of tutorials in instrumentation and measurements", IEEE Instrumentation and Measurement Magazine, vol. 9, no. 2, pp. 39-49, 2006.
Linnenbrink, T.E.., J.. Blair, S.. Rapuano, P.. Daponte, E.. Balestrieri, L. De Vito, S.. Max, and S.J.. Tilden, "Erratum: Addition to "ADC Testing" (IEEE Instrumentation and Measurement Magazine (2006))", IEEE Instrumentation and Measurement Magazine, vol. 9, no. 5, pp. 46, 2006.
Balestrieri, E.., P.. Daponte, and S.. Rapuano, "Recent developments on DAC modelling, testing and standardization", Measurement: Journal of the International Measurement Confederation, vol. 39, no. 3 SPEC. ISS., pp. 258-266, 2006.
Balestrieri, E.., "Some critical notes on DAC time domain specifications", Conference Record - IEEE Instrumentation and Measurement Technology Conference, pp. 930-935, 2006.
2005
Rapuano, S.., P.. Daponte, E.. Balestrieri, L.. De Vito, S.J.. Tilden, S.. Max, and J.. Blair, "ADC parameters and characteristics - Part 6 in a series of tutorials in instrumentation and measurement", IEEE Instrumentation and Measurement Magazine, vol. 8, no. 5, pp. 44-54, 2005.
Balestrieri, E.., S.. Moisa, and S.. Rapuano, "DAC static parameter specifications - Some critical notes", 14th Symposium on New Technologies in Measurement and Instrumentation and 10th Workshop on ADC Modelling and Testing, pp. 81-86, 2005.
Balestrieri, E.., P.. Daponte, and S.. Rapuano, "A state of the art on ADC error compensation methods", IEEE Transactions on Instrumentation and Measurement, vol. 54, no. 4, pp. 1388–1394, 2005.
Arpaia, P., E.. Balestrieri, P.. Daponte, C. De Capua, L. De Vito, S.. Rapuano, M. Riccio, L. Tomaciello, and F. Zoino, "Un Learning Management System che include esperimenti reali con strumentazione di misura", Atti del XXII Congresso Annuale GMEE: GMEE, pp. 414–423, 2005.
2004
Balestrieri, E.., P.. Daponte, and S.. Rapuano, "Digital to analog converters: A metrological overview", 9th IMEKO Workshop on ADC Modeling and Testing, IWADC 2004, Held Together with the 13th IMEKO TC4 Symposium on Measurements for Research and Industrial Applications, pp. 52-57, 2004.
Balestrieri, E.., P.. Daponte, and S.. Rapuano, "A state of the art on ADC error compensation methods", Conference Record - IEEE Instrumentation and Measurement Technology Conference, vol. 1, pp. 711-716, 2004.

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