skip to content
  • it
UNIVERSITÀ DEGLI STUDI
DEL SANNIO   Benevento
 

An improved ADC error correction scheme based on a Bayesian approach

De Vito, L., L. Michaeli, and S.. Rapuano, "An improved ADC error correction scheme based on a Bayesian approach", Proc. of IEEE Instrumentation and Measurement Technology Conference, pp. 160–164, 16/05/, 2005.