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UNIVERSITÀ DEGLI STUDI
DEL SANNIO   Benevento
 

An improved method for automatic detection and location of defects in electronic components using scanning ultrasonic microscopy

Bechou, L.., D.. Dallet, Y.. Danto, P.. Daponte, Y.. Ousten, and S.. Rapuano, "An improved method for automatic detection and location of defects in electronic components using scanning ultrasonic microscopy", Conference Record - IEEE Instrumentation and Measurement Technology Conference, vol. 1, pp. 65–70, 2001.